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The new 3D Atom Probe
will perform analysis of
semiconductor materials with near-atomic depth resolution. This is possible by
using a UV-Vis-IR ultrafast (400fs) laser
setup.
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xtronix
is a Swiss instrumentation supplier to academic and government research,
corporate R&D and hi-tech industries. Since our inception in 1988, one
of our key focuses has been on serving the hi-tech industry as well
as research labs with cutting edge products for Thin Films and Surface Science
Our customer base includes scientists and engineers in the fields of
materials, geology, astrophysics, semiconductors, life sciences and much more.
They are active in university research labs, governmental organizations and
private companies .
The importance of UHV for surface studies
UHV is essential for two principal reasons: a) it enable atomically clean
surfaces to be prepared for study, and such surfaces to be maintained in a
contamination-free state for the duration of the experiment and, b) it permits
use of low energy electron and ion-based experimental techniques without undue
interference from gas phase scattering.
To elaborate on these points,
click here to look at the variation of various parameters with pressure.
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Tour our
other product ranges! |
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UNI - Swiss SIMS
Swiss Geologists order their first
cutting-edge dynamic SIMS instrument
In a project financed by several Swiss Universities and to be based in the new
Geopolis building, Faculty of Geosciences and Environment of the University of
Lausanne, a top-end dynamic SIMS instrument will become the key piece of surface
science equipment for Swiss geologists.
The University of Lausanne (UNIL), in partnership with several other national
centers of higher education, have ordered an IMS 1280-HR SIMS. This advanced
system features a large geometry ion microprobe delivering unequalled analytical
performance for a wide range of applications: tracking geological processes
using stable isotopes, dating minerals, determining the presence of trace
elements, screening and analyzing large numbers of particles...
Secondary Ion Mass Spectrometry is a well-established and widely applied surface
analytical technique with over half a century of history.
The new IMS 1280-HR combines the well-proven features of the former IMS 1280
with new developments oriented toward specific geosciences applications
requiring very high mass resolution capabilities in both mono and
multi-collection modes. This high resolution tool is considered the most
advanced design in magnetic sector SIMS, and among the highest value stand-alone
analytical instruments for scientific research.
The IMS 1280-HR is the only large geometry ion microprobe performing both
microscope and microprobe imaging. Thanks to these superior imaging
capabilities, the IMS 1280-HR is able to map the distribution of major, minor
and trace elements or isotopes at sub-micron lateral resolution.
CERN Geneva
Q4 / 2010
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