SUBJECT: 'Webinar' - Kelvin Probe for Work Function

....  eNewsTronix - Products & Applications
 Volume 4  / Issue 04
 
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Dear Customer,

You are cordially invited to participate in the forthcoming internet seminar, entitled Introduction to the Traditional Kelvin Probe for High Resolution Work Function Measurement, which will be held Thursday, February 25th, 2010 at 17:00 hrs Swiss time.

This exciting, hour-long live educational seminar, will be moderated by Professor Joe Greene, Editor-in-Chief of "Thin Solid Films" Journal and led by Professor Iain Baikie, the inventor of the off-null and height-regulating Kelvin Probe, a world leader in work function measurements in UHV, Air and Controlled Atmosphere.
   
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There will be practical contributions from a panel of professionals in the field of surface science who have extensive experience using this versatile tool in a wide range of research projects. It aims to provide both a brief background history of the 'Baikie' Kelvin Probe and its subsequent development into the unique, cutting-edge measurement tool it has become. Click to register.

You will discover the advantages this highly sensitive research tool can offer and how to interpret the information it provides. You will also have an opportunity to ask questions related to this technique and how it could help with your research requirements. Please see the attached PDF to this eNews for further details of the event.
   
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Who should attend: Academic and industrial researchers, engineers and technologists involved with the development and characterization of materials, particularly in the fields of Photovoltaic cells, Nanotechnology, Metals, Semiconductors, Forensics, Polymer Electronics and Corrosion.

If you are unavailable for the live event you can still
register to view a recording which will be available after 25th February 2010 on the Elsevier website.

Cordially,

Xavier F. Gorra

 
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